SPIE Proceedings [SPIE Solving Quality Control &...

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SPIE Proceedings [SPIE Solving Quality Control & Reliability Problems with Optics - San Diego (Thursday 15 May 1975)] Solving Quality Control and Reliability Problems with Optics - The Application Of Optics To The Quality Control Of Automotive Components

McKeown, P. A., Cooke, P., Bailey, W. P., Amodei, Juan J., Lowell, Harry N.
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Volume:
60
Year:
1975
Language:
english
DOI:
10.1117/12.954389
File:
PDF, 4.32 MB
english, 1975
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