Using ToF-SIMS to study industrial surface phenomena

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Surface Science 2016 / 3

Using ToF-SIMS to study industrial surface phenomena

Smentkowski, Vincent S., Keenan, Michael R., Arlinghaus, Henrik
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Language:
english
Journal:
Surface Science
DOI:
10.1016/j.susc.2016.02.017
Date:
March, 2016
File:
PDF, 2.17 MB
english, 2016
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