SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

  • Main
  • SPIE Proceedings [SPIE SPIE Optical...

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Image quality improvement using speckle method in digital holography by means of multi-mode fiber

Funamizu, H., Lehmann, Peter H., Osten, Wolfgang, Shimoma, S., Aizu, Y., Albertazzi, Armando
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020961
File:
PDF, 424 KB
english, 2013
Conversion to is in progress
Conversion to is failed