SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Simultaneous laser vibrometry on multiple surfaces with a single beam system using range-resolved interferometry

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Kissinger, Thomas, Charrett, Thomas O. H., James, Stephen W., Adams, Alvin, Twin, Andrew, Tatam, Ralph P.
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Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2183281
File:
PDF, 5.15 MB
english, 2015
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