SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX - Aging behavior, reliability, and failure physics of GaN-based optoelectronic components
Jeon, Heonsu, Tu, Li-Wei, Krames, Michael R., Strassburg, Martin, Zanoni, Enrico, Meneghini, Matteo, Meneghesso, Gaudenzio, De Santi, Carlo, La Grassa, Marco, Buffolo, Matteo, Trivellin, Nicola, MontiVolume:
9768
Year:
2016
Language:
english
DOI:
10.1117/12.2225128
File:
PDF, 1.43 MB
english, 2016