SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - Raman microscopic analysis in museology
Withnall, Robert, Derbyshire, Alan, Thiel, Sigrun, Hughes, Michael J., Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, Max G., Lal, Ravindra B., Trolinger, James DVolume:
4098
Year:
2000
Language:
english
DOI:
10.1117/12.401632
File:
PDF, 2.16 MB
english, 2000