SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Novel solution for digital holographic interferometer design
Michalkiewicz, Aneta, Kujawinska, Malgorzata, Salbut, Leszek, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.545616
File:
PDF, 537 KB
english, 2004