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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Recent advancements in digital holographic microscopy and its applications
Ferraro, Pietro, Coppola, Giuseppe, Alfieri, Domenico, De Nicola, Sergio, Finizio, Andrea, Pierattini, Giovanni, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.554755
File:
PDF, 296 KB
english, 2004