SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Dual-wavelength holographic shape measurement with iterative phase unwrapping
Rosendahl, Sara, Bergström, Per, Gren, Per, Sjödahl, Mikael, Lehmann, Peter H., Osten, Wolfgang, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889424
File:
PDF, 1.60 MB
english, 2011