[IEEE 2014 International Conference on Information Science, Electronics and Electrical Engineering (ISEEE) - Sapporo, Japan (2014.4.26-2014.4.28)] 2014 International Conference on Information Science, Electronics and Electrical Engineering - Parameter-based contour error estimation for contour following accuracy improvements
Chen, Hung-Ruey, Su, Ke-Han, Cheng, Ming-Yang, Lu, Jie-ShiouYear:
2014
Language:
english
DOI:
10.1109/InfoSEEE.2014.6946199
File:
PDF, 250 KB
english, 2014