[IEEE 1997 IEEE MTT-S International Microwave Symposium Digest - Denver, CO, USA (8-13 June 1997)] 1997 IEEE MTT-S International Microwave Symposium Digest - A distributed, measurement based, nonlinear model of FETs for high frequencies applications
Mallet-Guy, B., Ouarch, Z., Prigent, M., Quere, R., Obregon, J.Volume:
2
Year:
1997
Language:
english
DOI:
10.1109/MWSYM.1997.602937
File:
PDF, 351 KB
english, 1997