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[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Stability analysis systems of the metrological providing and managements
Palchun, Yu. A., Yelistratova, I. B.Year:
2014
Language:
english
DOI:
10.1109/apeie.2014.7040871
File:
PDF, 760 KB
english, 2014