[IEEE 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2014.10.2-2014.10.4)] 2014 12th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Influence of diffraction divergence and wavefront curvature of the Gaussian beam on the error of length measurement

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