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[IEEE 2005 IEEE Antennas and Propagation Society International Symposium - Washington, DC, USA (3-8 July 2005)] 2005 IEEE Antennas and Propagation Society International Symposium - Quasi-Static Parameter Analysis for Arbitrary Metallization Thickness of RF MEMS Coupled Microstrip Lines
Jia-Hui Fu,, Qun Wu,, Yue-Mei Qin,, Xue-Mai Gu,, Jong-Chul Lee,Volume:
2B
Year:
2005
Language:
english
DOI:
10.1109/aps.2005.1552031
File:
PDF, 708 KB
english, 2005