[IEEE 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) - KaoHsiung, Taiwan (2014.11.10-2014.11.12)] 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Fully-integrated 40-Gb/s pulse pattern generator and bit-error-rate tester chipsets in 65-nm CMOS technology
Chen, Guan-Sing, Wu, Chin-Yang, Lin, Chen-Lun, Hung, Hao-Wei, Lee, JriYear:
2014
Language:
english
DOI:
10.1109/asscc.2014.7008872
File:
PDF, 2.95 MB
english, 2014