[IEEE Conference Record of the 1998 IEEE International Symposium on Electrical Insulation - Arlington, VA, USA (7-10 June 1998)] Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239) - Field-grading with semi-conducting materials based on silicon carbide (SiC)
Gartner, J., Gockenbach, E., Borsi, H.Volume:
1
Year:
1998
Language:
english
DOI:
10.1109/elinsl.1998.704697
File:
PDF, 494 KB
english, 1998