[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Measurement and modeling of a new width dependence of NMOSFET degradation
Schuler, F., Kowarik, O., Keitel-Schulz, D.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888190
File:
PDF, 244 KB
english, 1996