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[IEEE IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society - Denver, CO, USA (29 Nov.-2 Dec. 2001)] IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.37243) - Fault diagnosis using dynamic finite-state automaton models
Yun-Xia Xi,, Khiang-Wee Lim,, Weng-Khuen Ho,, Preisig, H.A.Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/iecon.2001.976530
File:
PDF, 637 KB
english, 2001