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[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Emulation of lossy channels using a low loss microstrip trace with added lossy materials
Qian, Wei, Li, Guanghua, Maheshwari, Pratik, Khikevich, Victor, Pommerenke, David, Ding, Chong, White, Douglas, Scearce, Stephen, Yang, YaochaoYear:
2014
Language:
english
DOI:
10.1109/isemc.2014.6899104
File:
PDF, 1.19 MB
english, 2014