Theoretical Analysis of Dielectric Modulated Drift Region...

IEEE Electron Device Letters 2015 / 4 Vol. 36; Iss. 4

Theoretical Analysis of Dielectric Modulated Drift Region for Si Power Devices

Zhou, Jiuyang, Huang, Chih-Fang, Chen, Yen-Hsin
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2015.2400457
Date:
April, 2015
File:
PDF, 544 KB
english, 2015
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