Reliability of 1310 nm Wafer Fused VCSELs
Sirbu, Alexei, Suruceanu, G., Iakovlev, V., Mereuta, A., Mickovic, Z., Caliman, A., Kapon, E.Volume:
25
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/lpt.2013.2271041
Date:
August, 2013
File:
PDF, 997 KB
english, 2013