Curvature of Substrates is Measured by Means of a...

IEEE Photonics Technology Letters 2014 / 11 Vol. 26; Iss. 21

Curvature of Substrates is Measured by Means of a Self-Mixing Scheme

Tambosso, Tiziana, Horng, Ray-Hua, Donati, Silvano
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Volume:
26
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/lpt.2014.2349958
Date:
November, 2014
File:
PDF, 428 KB
english, 2014
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