[IEEE 2006 International Semiconductor Conference - Sinaia, Romania (2006.09.27-2006.09.29)] 2006 International Semiconductor Conference - Atom Force Microscopy of SnO2 Nano Layers
Filevskaya, L.N., Smyntyna, V.A., Grinevich, V.S.Year:
2006
Language:
english
DOI:
10.1109/smicnd.2006.283932
File:
PDF, 3.06 MB
english, 2006