A Robust Algorithm for Microscopic Simulation of Avalanche...

IEEE Transactions on Electron Devices 2015 / 8 Vol. 62; Iss. 8

A Robust Algorithm for Microscopic Simulation of Avalanche Breakdown in Semiconductor Devices

Jabs, Dominic, Jungemann, Christoph, Bach, Karl Heinz
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2446132
Date:
August, 2015
File:
PDF, 2.88 MB
english, 2015
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