![](/img/cover-not-exists.png)
Dual-Gate JFET Modeling I: Generalization to Include MOS Gates and Efficient Method to Calculate Drain-Source Saturation Voltage
Xia, Kejun, McAndrew, Colin C., Grote, BernhardYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2525737
File:
PDF, 2.44 MB
english, 2016