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[IEEE Proceedings of the 5th European Workshop on Low Temperature Electronics - Grenoble, France (2002.6.21-2002.6.21)] Proceedings of the 5th European Workshop on Low Temperature Electronics - Random telegraph noise in ultimate MOSFETs at very low temperature in the subthreshold regime
Jehl, X., Sanquer, M., Bertrand, G., Guegan, G., Deleonibus, S.Year:
2002
Language:
english
DOI:
10.1109/wolte.2002.1022460
File:
PDF, 311 KB
english, 2002