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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 2 February 2013)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX - Quantitative phase analysis through scattering media by depth-filtered digital holography
Goebel, Sebastian, Cogswell, Carol J., Brown, Thomas G., Jaedicke, Volker, Koukourakis, Nektarios, Conchello, Jose-Angel, Wilson, Tony, Wiethoff, Helge, Adinda-Ougba, Adamou, Gerhardt, Nils C., Welp,Volume:
8589
Year:
2013
Language:
english
DOI:
10.1117/12.2001159
File:
PDF, 543 KB
english, 2013