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SPIE Proceedings [SPIE International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Singapore, Singapore (Tuesday 9 April 2013)] International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Two-dimensional sampling moiré method for fast and accurate phase analysis of single fringe pattern
Ri, Shien, Quan, Chenggen, Qian, Kemao, Tsuda, Hiroshi, Asundi, AnandVolume:
8769
Year:
2013
Language:
english
DOI:
10.1117/12.2018979
File:
PDF, 2.30 MB
english, 2013