SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - A lateral sensor for the alignment of two formation-flying satellites
Roose, S., Lehmann, Peter H., Osten, Wolfgang, Stockman, Y., Sodnik, Z., Albertazzi, ArmandoVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020341
File:
PDF, 832 KB
english, 2013