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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Speed-up chromatic sensors by optimized optical filters
Taphanel, Miro, Lehmann, Peter H., Osten, Wolfgang, Hovestreydt, Bastiaan, Beyerer, Jürgen, Albertazzi, ArmandoVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020387
File:
PDF, 592 KB
english, 2013