SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker
Hofherr, O., Lehmann, Peter H., Osten, Wolfgang, Wachten, C., Müller, C., Albertazzi, Armando, Reinecke, H.Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020499
File:
PDF, 1.06 MB
english, 2013