SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Advances in X-ray Free-Electron Lasers II: Instrumentation - Full characterization of a focused wave field with sub 100 nm resolution
Hoppe, Robert, Tschentscher, Thomas, Tiedtke, Kai, Meier, Vivienne, Patommel, Jens, Seiboth, Frank, Lee, Hae Ja, Nagler, Bob, Galtier, Eric C., Arnold, Brice, Zastrau, Ulf, Hastings, Jerome, Nilsson,Volume:
8778
Year:
2013
Language:
english
DOI:
10.1117/12.2020856
File:
PDF, 2.21 MB
english, 2013