SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - A soft x-ray beamline for quantitative nanotomography using ptychography
Lai, Barry, van Riessen, Grant A., Junker, Mark, Phillips, Nicholas W., Peele, Andrew G.Volume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2027211
File:
PDF, 586 KB
english, 2013