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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Image Processing: Machine Vision Applications VII - Symbolic feature detection for image understanding
Niel, Kurt S., Bingham, Philip R., Aslan, Sinem, Akgül, Ceyhun Burak, Sankur, BülentVolume:
9024
Year:
2014
Language:
english
DOI:
10.1117/12.2040783
File:
PDF, 1.80 MB
english, 2014