SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Dimensional Optical Metrology and Inspection for Practical Applications III - Deformation kinetics of layered personal protective material under impact via terahertz reflectometry
Harding, Kevin G., Yoshizawa, Toru, Rahman, Anis, Rahman, Aunik, Mentzer, Mark A.Volume:
9110
Year:
2014
Language:
english
DOI:
10.1117/12.2049792
File:
PDF, 765 KB
english, 2014