SPIE Proceedings [SPIE 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014) - Harbin, China (Saturday 26 April 2014)] 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of image plane illumination uniformity of photoelectric imaging system
Zhang, Yudong, Gao, Wei, Kang, Deng-kui, Yang, Hong, Sha, Ding-guo, Jiang, Chang-lu, Chen, Min, Zhong, Xing-hui, Ma, Shi-bang, Yuan, LiangVolume:
9282
Year:
2014
Language:
english
DOI:
10.1117/12.2067909
File:
PDF, 765 KB
english, 2014