SPIE Proceedings [SPIE Advanced Topics in Optoelectronics,...

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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2014 - Constanta, Romania (Thursday 21 August 2014)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII - Spectral characterization of the effect of the amber filters on the color hue of an image

Cristea, Ionica, Vladescu, Marian, Tamas, Razvan, Toadere, Florin
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Volume:
9258
Year:
2015
Language:
english
DOI:
10.1117/12.2070456
File:
PDF, 281 KB
english, 2015
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