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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Measuring, Modeling, and Reproducing Material Appearance 2015 - Estimating reflectance property from multi-focus images by light field camera and its application
Ortiz Segovia, Maria V., Urban, Philipp, Imai, Francisco H., Tsumura, Norimichi, Baba, Kaori, Yamamoto, Shoji, Sambongi, MasaoVolume:
9398
Year:
2015
Language:
english
DOI:
10.1117/12.2076324
File:
PDF, 2.19 MB
english, 2015