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SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation - Changsha/Zhangjiajie, China (Friday 8 August 2014)] Ninth International Symposium on Precision Engineering Measurement and Instrumentation - Precisely connected and calculated algorithm of punctate scratches in the super-smooth surface defects evaluation system
Cui, Junning, Tan, Jiubin, Wen, Xianfang, Li, Chen, Yang, Yongying, Cao, Pin, Wang, Shitong, Liu, Dong, Li, Lu, Yan, Lu, Li, Yang, Xie, Shibing, Chen, YangjieVolume:
9446
Year:
2015
Language:
english
DOI:
10.1117/12.2181189
File:
PDF, 802 KB
english, 2015