SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 9 August 2015)] Nanoimaging and Nanospectroscopy III - Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) (Presentation Recording)
Verma, Prabhat, Egner, Alexander, Jesacher, Alexander, Ritsch-Marte, Monika, Piestun, RafaelVolume:
9554
Year:
2015
Language:
english
DOI:
10.1117/12.2190639
File:
PDF, 114 KB
english, 2015