![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Advanced Lasers and Applications - Accurate measurement of illumination uniformity using spot sensor based 2-dimension scanning method
Zhu, Jianqiang, Gao, Chunqing, Xie, Chengke, Chen, Ming, Zhang, Youbao, Ma, Xinghua, Yang, Baoxi, Huang, HuijieVolume:
9621
Year:
2015
Language:
english
DOI:
10.1117/12.2192536
File:
PDF, 462 KB
english, 2015