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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Geometric error detection and calibration in laser trackers
Zhu, Jigui, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Han, Sen, Zhang, Zili, Lao, Dabao, Dong, Dengfeng, Zhou, WeihuVolume:
9623
Year:
2015
Language:
english
DOI:
10.1117/12.2193366
File:
PDF, 522 KB
english, 2015