SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 13 February 2016)] Quantitative Phase Imaging II - Study of in-homogeneities in PMMA samples using a 3D-SD-OCT system
Popescu, Gabriel, Park, YongKeun, Briones R., Manuel de Jesús, De la Torre-I., Manuel H., Flores-M., Jorge M., Tavera, Cesar G., Luna H., Juan M., Mendoza S., FernandoVolume:
9718
Year:
2016
Language:
english
DOI:
10.1117/12.2217269
File:
PDF, 1.47 MB
english, 2016