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SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Optical Fabrication, Testing, and Metrology II - Optical design, manufacturing, and tests of the MUSE image slicer
Laurent, Florence, Renault, Edgard, Bacon, Roland, Dubois, Jean-Pierre, Hénault, François, Robert, DanielVolume:
5965
Year:
2005
Language:
english
DOI:
10.1117/12.624836
File:
PDF, 2.47 MB
english, 2005