SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical and Digital Image Processing - Flaw detection and segmentation in textile inspection
Schelkens, Peter, Millán, María S., Ralló, Miquel, Ebrahimi, Touradj, Cristóbal, Gabriel, Escofet, Jaume, Truchetet, FrédéricVolume:
7000
Year:
2008
Language:
english
DOI:
10.1117/12.786528
File:
PDF, 760 KB
english, 2008