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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Research of precision interference locating method for a partial null compensator at aspheric testing
Yang, Yongying, Burge, James H., Fähnle, Oliver W., Liu, Dong, Xin, Gao, Williamson, Ray, Tian, Chao, Luo, Yongjie, Shen, Yibing, Zhuo, YongmoVolume:
7426
Year:
2009
Language:
english
DOI:
10.1117/12.825830
File:
PDF, 381 KB
english, 2009