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SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Practical Holography XXIV: Materials and Applications - Tolerance analysis in single-shot phase-shifting digital holography based on the spatial carrier interferometry
Harada, Yasuhiro, Wan, Aizuddin, Sasaki, Yuichi, Bjelkhagen, Hans I., Kostuk, Raymond K.Volume:
7619
Year:
2010
Language:
english
DOI:
10.1117/12.842878
File:
PDF, 1.10 MB
english, 2010