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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - Managing the depth of focus in 3D imaging through controlled distortion of digital holograms
Paturzo, M., Memmolo, P., Finizio, A., Ferraro, P., Gorecki, Christophe, Asundi, Anand K., Osten, WolfgangVolume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.855884
File:
PDF, 3.23 MB
english, 2010