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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Statistical interior tomography
Stock, Stuart R., Xu, Qiong, Yu, Hengyong, Mou, Xuanqin, Wang, GeVolume:
7804
Year:
2010
Language:
english
DOI:
10.1117/12.860362
File:
PDF, 613 KB
english, 2010