![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - High-resolution x-ray phase tomography
Stock, Stuart R., Peele, Andrew G., Thomas, C. David L., Clement, John G., Arhatari, Benedicta D., Hannah, Kevin M., Doshi, Chandni, Putkunz, Corey T., Clark, Jesse N.Volume:
7804
Year:
2010
Language:
english
DOI:
10.1117/12.862177
File:
PDF, 2.84 MB
english, 2010